Stiebing, K. E.

Paper	Title	Page
MOPO-02	Beam-Profile/Emittance Measurements at the Frankfurt ECRIS	61
	K. E. Stiebing, S. Enz, Th. Kruppi IKF, Frankfurt am Main
	The off-line analysis program of the Frankfurt Emittance and Profile Monitor has been improved to allow better access to the calibrated Profile- and Emittance representations. With the new system Profile / Emittance scans can be performed and directly interpreted at run time with measuring times of 2-3min per full scan. With this significantly improved performance a series of measurements has been carried out, pursuing the issue of beam filamentation in the extraction region of the 14GHZ Frankfurt ECRIS. The new program development will be presented together with results from the measurements.
	Poster
MOPO-18	Microwave Power Saving and Reduced Bremsstrahlung Emission for a High Charge State Ion Production in an ECRIS Equipped with MD Structures	111
	L. Schachter, S. Dobrescu IFIN, Magurele- Bucuresti K. E. Stiebing IKF, Frankfurt-am-Main
	Metal dielectric structures (MD) installed in the plasma chamber of the Frankfurt 14GHz electron cyclotron resonance ion source (ECRIS), have been used to significantly reduce the level of microwave power, necessary to create comparable ion intensities as for the standard operation of the Frankfurt ECRIS. The measurements indicate that the RF-power may be reduced by a factor of 2-3 to obtain the same output of high argon charge states as in the standard source with stainless steel plasma chamber. This reduced level of microwave power also leads to a much lower level of X-ray emission from the source.
	Poster