A   B   C   D   E   F   G   H   I   J   K   L   M   N   O   P   R   S   T   U   V   W   Y   Z  

Galkin, S.

Paper Title Page
TUCO-C04 Far-Tech's ECR Charge Breeder Optimization Simulation Toolset - MCBC, GEM, and IonEx 156
 
  • J. S. Kim, I. N. Bogatu, B. Cluggish, S. Galkin, L. Grubert, L. Zhao
    Far-Tech, Inc., San Diego, California
 
  Funding: This work is supported by the US DOE SBIR program.

FAR-TECH has been developing ECR charge breeder optimization toolset. It consists of three computational modules: [1] the GEM (General ECRIS Model) code, [2] the MCBC (Monte Carlo Beam Capture) code, and [3] the IonEx (Ion extraction) code. The GEM code simulates ECR plasmas via Fokker-Plank electrons and ion fluids. MCBC is a particle tracking code to trace the injected charge breeder beam ions, and IonEx simulates the ion extraction region accurately by resolving the plasma sheaths at the extraction region. Current status of the work will be presented along with examples.

[1] J. S. Kim, L. Zhao, B. P. Cluggish, I. N. Bogatu, and R. Pardo, 'Electron cyclotron resonance charge breeder ion source simulation by MCBC', Rev. Sci. Instrum. 79, 02B906 (2008) [2] D. H. Edgell, J. S. Kim, S. K. Wong, R. C. Pardo and R. C. Vondrasek, Rev. Sci. Instrum. 71, 666 (2000) [3] B. P. Cluggish, S. A. Galkin, and J. S. Kim, 'Modeling Ion Extraction from an ECR Ion Source', Proceeding of the 2007 Particle Accelerator Conference, Albuquerque, NM, June 25-29, 2007

 
slides icon Slides