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| MOPO-02 |
Beam-Profile/Emittance Measurements at the Frankfurt ECRIS
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61 |
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- K. E. Stiebing, S. Enz, Th. Kruppi
IKF, Frankfurt am Main
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The off-line analysis program of the Frankfurt Emittance and Profile Monitor has been improved to allow better access to the calibrated Profile- and Emittance representations. With the new system Profile / Emittance scans can be performed and directly interpreted at run time with measuring times of 2-3min per full scan. With this significantly improved performance a series of measurements has been carried out, pursuing the issue of beam filamentation in the extraction region of the 14GHZ Frankfurt ECRIS. The new program development will be presented together with results from the measurements.
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Poster
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