Paper |
Title |
Other Keywords |
Page |
CT04 |
Bunch Length Measurements in LEP
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pick-up, synchrotron, impedance, photon |
59 |
|
- A.J. Burns, H. Schmickler
CERN, Geneva, Switzerland
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For many years a streak camera has been used for
observing the longitudinal distribution of the particles in
any LEP e+ or e- bunch (5-50 ps r.m.s. length) on a turn
by turn basis, using synchrotron light. In 1996, a
comparison made with the longitudinal vertex
distributions of 3 LEP experiments allowed the
identification and elimination of certain systematic errors
in the streak camera measurements. In 1997, a new bunch
length measurement technique was commissioned that
uses the high frequency slope of the bunch power
spectrum from a button pickup. In 1998, this new method
was confronted with measurements from the streak
camera and the LEP experiments. The measurements
made in 1996 and 1998 are presented, with emphasis on
the calibration of the two instrumental methods and their
respective precision and limitations.
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PS20 |
A current digitizer for ionisation chambers/SEMS with high resolution and fast resoponse
|
ion, power-supply, electron, pick-up |
147 |
|
- H. Reeg
GSI, Gesellschaft für Schwerionenforschung, Darmstadt, Germany
|
A current-to-frequency converter (CFC), recently
developed, exhibits a response time up to the ms region.
The frequency limit is raised beyond 1 MHz, extending
the linear range by a factor of 100. The conversion
factor reaches 10-13 C/pulse. The converter is
employed, combined with ionization chambers (IC) and
secondary electron emission monitors (SEM), to
measure the intensity of the extracted beam in the
transfer lines adjoining GSI's heavy ion synchrotron
(SIS). Fast intensity fluctuations during the particle
spill can be observed.
Reduced hum and noise pickup, better handling and
mounting flexibility as well as reduced costs are
achieved building up the spill monitoring system with
distributed components.
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PT08 |
A fast protection system for narrow-gap insertion device vessels
|
insertion, beam-losses, insertion-device, injection |
174 |
|
- M.J. Dufau, R.J. Smith
CLRC, Daresbury Laboratory, Warrington, UK
|
Presented in this paper are details of an electronic,
beam position based interlock system, which has been
designed to protect narrow - gap insertion device vessels
from the thermal damage that would result from mis
steered beam. Details of system design and operational
experience are presented, and the paper concludes with an
outline proposal for a system enhancement, that would
offer diagnostic information immediately prior to an
excessive beam displacement trip.
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