A   B   C   D   E   F   G   H   I   K   L   M   O   P   Q   R   S   T   V   W    

monitoring

Paper Title Other Keywords Page
CT04 Bunch Length Measurements in LEP pick-up, synchrotron, impedance, photon 59
 
  • A.J. Burns, H. Schmickler
    CERN, Geneva, Switzerland
  For many years a streak camera has been used for observing the longitudinal distribution of the particles in any LEP e+ or e- bunch (5-50 ps r.m.s. length) on a turn by turn basis, using synchrotron light. In 1996, a comparison made with the longitudinal vertex distributions of 3 LEP experiments allowed the identification and elimination of certain systematic errors in the streak camera measurements. In 1997, a new bunch length measurement technique was commissioned that uses the high frequency slope of the bunch power spectrum from a button pickup. In 1998, this new method was confronted with measurements from the streak camera and the LEP experiments. The measurements made in 1996 and 1998 are presented, with emphasis on the calibration of the two instrumental methods and their respective precision and limitations.  
 
PS20 A current digitizer for ionisation chambers/SEMS with high resolution and fast resoponse ion, power-supply, electron, pick-up 147
 
  • H. Reeg
    GSI, Gesellschaft für Schwerionenforschung, Darmstadt, Germany
  A current-to-frequency converter (CFC), recently developed, exhibits a response time up to the ms region. The frequency limit is raised beyond 1 MHz, extending the linear range by a factor of 100. The conversion factor reaches 10-13 C/pulse. The converter is employed, combined with ionization chambers (IC) and secondary electron emission monitors (SEM), to measure the intensity of the extracted beam in the transfer lines adjoining GSI's heavy ion synchrotron (SIS). Fast intensity fluctuations during the particle spill can be observed. Reduced hum and noise pickup, better handling and mounting flexibility as well as reduced costs are achieved building up the spill monitoring system with distributed components.  
 
PT08 A fast protection system for narrow-gap insertion device vessels insertion, beam-losses, insertion-device, injection 174
 
  • M.J. Dufau, R.J. Smith
    CLRC, Daresbury Laboratory, Warrington, UK
  Presented in this paper are details of an electronic, beam position based interlock system, which has been designed to protect narrow - gap insertion device vessels from the thermal damage that would result from mis steered beam. Details of system design and operational experience are presented, and the paper concludes with an outline proposal for a system enhancement, that would offer diagnostic information immediately prior to an excessive beam displacement trip.