• C.A. Thomas, I.P.S. Martin, G. Rehm
  Diamond, Oxfordshire

During normal operation of synchrotron third generation light source like Diamond, the measurement of the electron bunch profile, of the order of 10~ps, is perfectly done with a streak camera. However, in 'low alpha' operation, where the momentum compaction factor is reduced in order to shorten the bunch length, the measurement becomes extremely close to the resolution of the camera. In such a case, performing a good measurement and extracting the real information requires a good knowledge of the impulse response of the streak camera. We present analysis and measurement of the contributions to the point spread function of the streak camera: the static point obtained by measuring a focussed beam without any sweep, which can be achieved at best around 5.5 pixels (0.7~ps with the fastest sweep), but also the chirp introduced by refractive optics and a large spectral beam, measured with a spectrograph at 26~fs/nm. Then we discuss short bunch measured in 'low alpha' operation and the agreement between measurements and expectation from theory.

• C. Bloomer, J.R. Brandao-neto, G. Rehm, C.A. Thomas
  Diamond, Oxfordshire

A relatively new development for synchrotron light sources is the concept of producing two independent X-ray beams in a single straight using two canted undulators. Two beams, separated by an angular divergence in the order of 1 mrad, proceed down the same front end before being separated into two experimental hutches. This creates a challenge for the position measurement of the two adjacent X-ray beams in the front end. Traditional four blade tungsten vane XBPMs are an established solution for accurate and reliable monitoring of the position of a single beam, so this approach has been developed to create an eight blade XBPM that is capable of resolving two beams independently. This paper presents first results from Diamond’s I04 and J04 IDs and illustrates the techniques used for position calibration and background subtraction.