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Lauth, W.

Paper Title Page
TUPD39 Investigation of the Light Yield of Luminescent Screens for High Energetic and High Brilliant Electron Beams 387
 
  • G. Kube
    DESY, Hamburg
  • W. Lauth
    IKP, Mainz
 
 

For the European XFEL with a maximum beam energy of 20 GeV and an average beam power of up to 300 kW it is planned to install beam profile monitors in the dump sections in order to control beam position and size. Usually OTR monitors are used for electron profile measurements. For intense beams however, thermal load in the screen material may result in resolution degradation and even screen damage. To overcome this problem the beam can be swept over the screen, but the strong OTR light emission directivity will reduce the optical system's collection efficiency. Therefore it is planned to use luminescent screens because of their robustness and isotropic light emission. While only little information is available about scintillator properties for applications with high energetic electrons, a test experiment has been performed at the 855 MeV beam of the Mainz Microtron MAMI in order to study light yield and robustness of different screen materials like Aluminum and Zirconium oxide under electron bombardment. The results will be compared to independent measurements from studies with heavy ion beams.