| Paper | Title | Page |
|---|---|---|
| TUPB02 | Beam Induced Fluoresence Monitor and Imaging Spectrography of Different Working Gases | 161 |
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As conventional intercepting diagnostics will not withstand high intensity ion beams, Beam Induced Fluorescence (BIF) profile monitors constitute a pre-eminent alternative for online profile measurements. At present two BIF monitors are installed at the GSI UNILAC and several locations are planned for the FAIR high energy beam transport lines. For further optimizations accuracy issues like gas dynamics have to be investigated systematically. Especially the determination of focused beams in front of targets or beam intensities near the space charge limit rely on a careful selection of proper working gas transitions to keep profile distortions as low as possible. With an imaging spectrograph beam induced fluorescence spectra in the range of 300-800 nm were investigated. Wavelength-selective beam profiles were obtained for 5 MeV/u sulphur and tantalum beams in nitrogen, xenon, krypton, argon and helium gas at pressures below 10-3 mbar. In the calibrated BIF spectra the specific gas transitions were identified. The measurement results are compared with particle tracking simulations and discussed for typical applications at the present setup and the future FAIR facility. |