Paper | Title | Page |
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TUPD04 | Dual Beam X-ray Beam Position Monitor | 294 |
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A relatively new development for synchrotron light sources is the concept of producing two independent X-ray beams in a single straight using two canted undulators. Two beams, separated by an angular divergence in the order of 1 mrad, proceed down the same front end before being separated into two experimental hutches. This creates a challenge for the position measurement of the two adjacent X-ray beams in the front end. Traditional four blade tungsten vane XBPMs are an established solution for accurate and reliable monitoring of the position of a single beam, so this approach has been developed to create an eight blade XBPM that is capable of resolving two beams independently. This paper presents first results from Diamond’s I04 and J04 IDs and illustrates the techniques used for position calibration and background subtraction. |