MOO1A  —  Monday, first oral session   (21-May-07   09:00—10:50)

Chair: L. Badano, ELETTRA, Basovizza, Trieste

Paper Title Page
MOO1A02 High Resolution Transverse Profile Measurement 1
 
  • E. Bravin
    CERN, Geneva
 
  In many cases the performance of a particle accelerator is in large part defined by the transverse emittance of the beams. In most cases, like colliders and light sources (Synchrotrons or Free Electron Lasers), the quality of the final product, i.e. luminosity and brilliance, is directly linked to this parameter. For this reason many techniques and devices have been developed over the years for monitoring the transverse distribution of particles along accelerator chains or over machine cycles. Moreover modern designs of accelerators allow smaller size and/or higher current beams. New, more demanding, emittance measurement techniques have to be introduced and existing ones expanded. This presentation will review the different methods and the different instruments developed so far.  
MOO1A03 Review of Synchrotron Radiation based Diagnostics for Transverse Profile Measurements 6
 
  • G. Kube
    DESY, Hamburg
 
  The transverse particle beam emittance is a crucial accelerator parameter because it is directly related to the brilliance of a synchrotron light source or the luminosity of a particle beam collider. Therefore a precise online control of the beam profile is highly desirable from which the corresponding emittance can be calculated. In addition observation of the particle beam shape's time-like evolution allows to study effects as for example injection mismatch and dynamical beta beating which are important for smooth-running accelerator operation. Due to its non-destructive nature synchrotron radiation is a versatile tool for beam profile measurements and is used in nearly every accelerator. While in principle synchrotron radiation from insertion devices or bending magnets can be utilized, in reality most accelerators use bending magnet radiation based profile monitoring because of space limitations. There exist a number of different techniques in order to overcome limitations due to resolution broadening effects which can result in theoretical resolutions down to the sub-micron level. In this talk an overview over the methods presently applied in most accelerators will be given.