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- S. Barabin, V. Batalin, A. Kozlov, T. Kulevoy, R. Kuybida, D.A. Liakin, A. Orlov, V. Pershin, S. Petrenko, D. Selezniov, Yu. Stasevich
ITEP, Institute for Theoretical and Experimental Physics, Moscow, Russia
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The new test-bench for heavy ion sources has been created in ITEP. It is
planned to equip test-bench with a set of measurement devices to cover
wide range of beam widths, divergences, durations, currents etc. It will
provide measurements of different heavy ion beams parameters,
particularly, emittance and charge state distribution. The last parameter
may be measured both by the time-of-flight method and with the magnet
analyzer. Two emittance measurement devices will be installed. It will be
possible to use both slit/grid and CCD based "pepperpot" methods, which
will give advantages of combination of classical emittance measurements
with performance of the CCD based devices. The detailed description of
test-bench and its equipment is presented. The first results at MEVVA ion
source and beam investigations are discussed.
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