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The complete longitunal profiling of short electron bunches is discussed
in the context of 4th generation light sources. The high peak current
required for the SASE lasing process is achieved by longitudinal
compression of the electron bunch. The lasing process also depends on of
the preservation of the transverse emittance along the bunch during
this manipulation in longitudinal phase space. Beam diagnostic
instrumentation needs to meet several challenges: The bunch length and
longitudinal profile should be measured on a single bunch to characterize
the instantaneous, peak current along the bunch. Secondly, the transverse
emittance and longitudinal energy spread should be measured for slices of
charge along the bunch. Several techniques for invasive and noninvasive
bunch profiling will be reviewed, using as examples recent measurements
from the SLAC Sub Picosecond Photon Source (SPPS) and the planned
diagnostics for the Linac Coherent Light Source (LCLS). These include
transverse RF deflecting cavities for temporal streaking of the electron
bunch, RF zero-phasing techniques for energy correlation measurements,
and electro-optic measurements of the wake-field profile of the bunch.
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