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Knippels, G.M.H.

Paper Title Page
IT05 Single Shot Electron-Beam Bunch Length Measurements 20
 
  • G. Berden, G.M.H. Knippels, D. Oepts, A.F.G. van der Meer
    FOM, Institute for Plasma Physics 'Rijnhuizen', Nieuwegein, The Netherlands
  • S.P. Jamison, X. Yan, A.M. MacLeod, W.A. Gillespie
    Abertay, University of Abertay Dundee, Dundee, UK
  • J.L. Shen
    CNU, Capital Normal University, Beijing, China
  • I. Wilke
    RPI, Rensselaer Polytechnic Institute, Troy, NY, USA
 
  It is recognised by the Instrumentation community that 4th generation light sources (like TESLA, LCLS) are posing some of the most stringent requirements on beam diagnostics. Among these, the single-shot electro-optic measurement of the bunch length and shape in the sub-picosecond domain is an ongoing development. The electro-optic detection method makes use of the fact that the local electric field of a highly relativistic electron bunch moving in a straight line is almost entirely concentrated perpendicular to its direction of motion. This electric field makes an electro-optic crystal placed in the vicinity of the beam birefringent. The amount of birefringence depends on the electric field and is probed by monitoring the change of polarization of the wavelength components of a chirped, synchronized Ti:sapphire laser pulse. This talk will provide details of the experimental setup at the Free Electron Laser for Infrared eXperiments (FELIX) in Nieuwegein, The Netherlands, where single shot images have been obtained of 1.7 ps long electron bunches (beam energy 46 MeV, charge per bunch 200 pC). Furthermore, future upgrading possibilities will be discussed.