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PS06 Laser Profile Measurements of an H-Beam instrumentation, diagnostics, emittance 114
 
  • R. Connolly, P. Cameron, J. Cupolo, M. Grau, M. Kesselmann, C-J. Liaw, R. Sikora
    BNL, Brookhaven National Laboratory, Upton, NY, USA
  A non-intercepting beam profile monitor for H--beams is being developed at Brookhaven National Lab. An H- ion has a first ionization potential of 0.75eV. Electrons can be removed from an H--beam by passing light from a near-infrared laser through it. Experiments have been performed on the BNL linac to measure the transverse profile of a 750keV beam by using a Nd:YAG laser to photoneutralize narrow slices of the beam. The laser beam is scanned across the ion beam neutralizing the portion of the beam struck by the laser. The electrons are removed from the ion beam and the beam current notch is measured.