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single-bunch

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PS03 Optical Bunch-By-Bunch Diagnostic System in KEK-PF instrumentation, diagnostics, KEK-PF 105
 
  • T. Kasuga, M. Mochihashi, T. Obina, Y. Tanimoto
    KEK, High Energy Accelerator Research Organization, Ibaraki, Japan
  An optical bunch-by-bunch beam diagnostic system, which can detect oscillations of individual bunches in a multibunch operation, has been developed. The system is composed of a high-speed light shutter and an optical beamoscillation detector. The shutter that consists of a pockels cell and polarizers can be opened or closed in a bunch spacing time (2ns in KEK-PF) and it can select a light pulse corresponding to a certain bunch in a bunch train. The beam oscillation detector can detect oscillations of the pickedout bunch with a spectral analysis method. The diagnostic system has been installed in KEK-PF Beamline-21, and observed vertical oscillation of individual bunches due to an instability in the multi-bunch operation.