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Weitkamp, T.

Paper Title Page
CT09 X-Ray Interference Methods of Electron Beam Diagnostics 88
 
  • O. Chubar, A. Snigirev, S. Kuznetsov, T. Weitkamp
    ESRF, Grenoble, France
  • V. Kohn
    RRC, Russian Research Center 'Kurchatov Institute', Moscow
 
  Electron beam diagnostics methods based interference and diffraction of synchrotron radiation (SR) in hard X-ray range will be discussed. Two simple optical schemes providing X-ray interference patterns highly sensitive to transverse size of the emitting electron beam, will be considered. For each scheme, the visibility of fringes in the pattern depends on transverse size of the electron beam. However, the pattern is also determined by the scheme geometry, shape and material of diffracting bodies. Therefore, for correct interpretation of the experimental results, high-accuracy computation of SR emission and propagation in the framework of physical optics should be used. Examples of practical measurements and processing of the results are presented.  
PS12 Source Imaging with Compound Refractive Lenses 132
 
  • O. Chubar, M. Drakopoulos, A. Snigirev, T. Weitkamp
    ESRF, European Synchrotron Radiation Facility, Grenoble, France