Paper |
Title |
Page |
CT09 |
X-Ray Interference Methods of Electron Beam Diagnostics
|
88 |
|
- O. Chubar, A. Snigirev, S. Kuznetsov, T. Weitkamp
ESRF, Grenoble, France
- V. Kohn
RRC, Russian Research Center 'Kurchatov Institute', Moscow
|
|
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Electron beam diagnostics methods based interference and diffraction of
synchrotron radiation (SR) in hard X-ray range will be discussed. Two
simple optical schemes providing X-ray interference patterns highly
sensitive to transverse size of the emitting electron beam, will be
considered. For each scheme, the visibility of fringes in the pattern
depends on transverse size of the electron beam. However, the pattern is
also determined by the scheme geometry, shape and material of diffracting
bodies. Therefore, for correct interpretation of the experimental
results, high-accuracy computation of SR emission and propagation in the
framework of physical optics should be used. Examples of practical
measurements and processing of the results are presented.
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|
PS12 |
Source Imaging with Compound Refractive Lenses
|
132 |
|
- O. Chubar, M. Drakopoulos, A. Snigirev, T. Weitkamp
ESRF, European Synchrotron Radiation Facility, Grenoble, France
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|