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Cupolo, J.

Paper Title Page
IT09 Overview of RHIC Beam Instrumentation and First Experience from Operation
Work performed under the auspices of the U.S. Department of Energy
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  • P. Cameron, P. Cerniglia, R. Connolly, J. Cupolo, C. Degen, K.A. Drees, D. Gassner, M. Kesselmann, R. Lee, T. Satogata, R. Sikora
    BNL, Brookhaven National Laboratory, Upton, NY, USA
 
  A summary of the beam instrumentation tools in place during the year 2000 commissioning run is given including the technical layout and the appearance on the user level, here mainly the RHIC control room. Experience from rst usage is reported as well as the lessons we have learned during RHIC operation so far. Upgrades and changes compared to the year 2000 systems are outlined. Described tools include beam position monitors (BPM), ionization prole monitors (IPM), beam loss monitors (BLM), bunch current measurements, luminosity monitors, tune meters and Schottky monitors.  
PS06 Laser Profile Measurements of an H-Beam 114
 
  • R. Connolly, P. Cameron, J. Cupolo, M. Grau, M. Kesselmann, C-J. Liaw, R. Sikora
    BNL, Brookhaven National Laboratory, Upton, NY, USA
 
  A non-intercepting beam profile monitor for H--beams is being developed at Brookhaven National Lab. An H- ion has a first ionization potential of 0.75eV. Electrons can be removed from an H--beam by passing light from a near-infrared laser through it. Experiments have been performed on the BNL linac to measure the transverse profile of a 750keV beam by using a Nd:YAG laser to photoneutralize narrow slices of the beam. The laser beam is scanned across the ion beam neutralizing the portion of the beam struck by the laser. The electrons are removed from the ion beam and the beam current notch is measured.