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RIS citation export for THPOSRP13: Investigation of Ion Trapping and Beam-Induced Fluorescence at the Electron Cooler Test-Bench at HIM

TY  - CONF
AU  - Beiser, Th.
AU  - Aulenbacher, K.
AU  - Dietrich, J.
ED  - Tranquille, Gérard Alain
ED  - Schaa, Volker RW
ED  - Petit-Jean-Genaz, Christine
ED  - Jørgensen, Lars Varming
TI  - Investigation of Ion Trapping and Beam-Induced Fluorescence at the Electron Cooler Test-Bench at HIM
J2  - Proc. of COOL2023, Montreux, Switzerland, 08-13 October 2023
CY  - Montreux, Switzerland
T2  - International Workshop on Beam Cooling and Related Topics
T3  - 14
LA  - english
AB  - Beam-current dependent and wavelength-resolved studies of the beam-induced fluorescence at the cooler teststand recorded with a low-noise, cooled sCMOS-camera, will be presented. As a new feature, a high-voltage switch was utilized for beam interruptions, counteracting ion trapping.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 76
EP  - 78
KW  - electron
KW  - photon
KW  - cathode
KW  - background
KW  - vacuum
DA  - 2024/04
PY  - 2024
SN  - 2226-0374
SN  - 978-3-95450-245-5
DO  - doi:10.18429/JACoW-COOL2023-THPOSRP13
UR  - https://jacow.org/cool2023/papers/thposrp13.pdf
ER  -