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Jaeglé, P.
Paper
Title
Page
SRF97D09
Niobium Surface Defect Induced by Strong Electric Field Probed by Soft X-Ray Laser Interferometry
873
F. Albert
, Ph. Zeitoun, D. Joyeux, A. Carillon, S. Hubert,
P. Jaeglé
, G. Jamelot, A. Klisnick, D. Phalippou, D. Ros, S. Sebban
Université Paris Sud, Orsay
M. Boussoukaya, A. Zeitoun-Fakiris
CEN-Saclay, Gif-Sur-Yvette