SRF2013 - List of Authors (Yamamoto, Y.)

Paper	Title	Page
TUP114	XT-map System for Locating SC Cavity Quench Position	747
	H. Tongu, Y. Iwashita Kyoto ICR, Uji, Kyoto, Japan H. Hayano, Y. Yamamoto KEK, Ibaraki, Japan
	XT-map system under development in collaboration between Kyoto University and KEK is a combined system of the temperature mapping (T-map) and X-ray mapping (X-map). High resolution T-map at quench detection will give more information for improving yield in production of high performance SC Cavities. The high-density sensor distribution of the XT-map gives the high resolution. Because the huge amount of sensor lines are multiplexed at a hi-speed scanning rate in the vicinity of the sensors, the small number of signal lines makes the installation process easy and reduces the system complexity. The scanning test of this XT-map system has been performed in the vertical test at KEK. The detected quench events will be reported.

TUP116	Quench field and Location in Vertical Tests at KEK-STF	751
	Y. Yamamoto, E. Kako, T. Shishido KEK, Ibaraki, Japan
	Many vertical tests have been done for the ILC and ERL at KEK-STF since 2008. T-mapping system (fixed type) was equipped at every vertical test, and quench location was identified completely. Every quench location at quench field will be presented in this paper.

Paper

Title

Page

XT-map System for Locating SC Cavity Quench Position

747

H. Tongu, Y. Iwashita
Kyoto ICR, Uji, Kyoto, Japan
H. Hayano, Y. Yamamoto
KEK, Ibaraki, Japan

XT-map system under development in collaboration between Kyoto University and KEK is a combined system of the temperature mapping (T-map) and X-ray mapping (X-map). High resolution T-map at quench detection will give more information for improving yield in production of high performance SC Cavities. The high-density sensor distribution of the XT-map gives the high resolution. Because the huge amount of sensor lines are multiplexed at a hi-speed scanning rate in the vicinity of the sensors, the small number of signal lines makes the installation process easy and reduces the system complexity. The scanning test of this XT-map system has been performed in the vertical test at KEK. The detected quench events will be reported.

TUP116

Quench field and Location in Vertical Tests at KEK-STF

751

Y. Yamamoto, E. Kako, T. Shishido
KEK, Ibaraki, Japan

Many vertical tests have been done for the ILC and ERL at KEK-STF since 2008. T-mapping system (fixed type) was equipped at every vertical test, and quench location was identified completely. Every quench location at quench field will be presented in this paper.