SRF2013 - List of Authors (Tsindlekht, M.I.)

Paper	Title	Page
TUP022	Study of AC/RF Properties of SRF Ingot Niobium	469
	P. Dhakal, G. Ciovati, G.R. Myneni JLAB, Newport News, Virginia, USA V.M. Genkin, M.I. Tsindlekht The Hebrew University of Jerusalem, The Racah Institute of Physics, Jerusalem, Israel
	Funding: Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177. In an attempt to correlate the SRF performance of niobium cavities with the superconducting properties, we present the results of the magnetization and ac susceptibility of the niobium used in the superconducting radiofrequency cavity fabrications which were subjected to buffer chemical polishing surface and high temperature heat treatments, typically applied to the SRF cavities fabrications. The analysis of the results show the different surface and bulk ac conductivity for the samples subjected to BCP and HT. Furthermore, the RF surface impedance is measured on the sample using the TE011 microwave cavity for a comparison to the low frequency measurements.

Paper

Title

Page

Study of AC/RF Properties of SRF Ingot Niobium

469

P. Dhakal, G. Ciovati, G.R. Myneni
JLAB, Newport News, Virginia, USA
V.M. Genkin, M.I. Tsindlekht
The Hebrew University of Jerusalem, The Racah Institute of Physics, Jerusalem, Israel

Funding: Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177.
In an attempt to correlate the SRF performance of niobium cavities with the superconducting properties, we present the results of the magnetization and ac susceptibility of the niobium used in the superconducting radiofrequency cavity fabrications which were subjected to buffer chemical polishing surface and high temperature heat treatments, typically applied to the SRF cavities fabrications. The analysis of the results show the different surface and bulk ac conductivity for the samples subjected to BCP and HT. Furthermore, the RF surface impedance is measured on the sample using the TE011 microwave cavity for a comparison to the low frequency measurements.