Author: Sawlanski, O.
Paper Title Page
MOP029 Cryo-Losses Measurements of the XFEL Prototype and Pre-Series Cryomodules 162
 
  • S. Barbanotti, J. Eschke, K. Jensch, W. Maschmann, O. Sawlanski
    DESY, Hamburg, Germany
  • W. Gaj, L.M. Kolwicz-Chodak, W. Maciocha
    IFJ-PAN, Kraków, Poland
  • X. Wang
    ESS, Lund, Sweden
 
  Cryo-losses measurements of the XFEL prototype and pre-series cryomodules are here presented and compared with the XFEL requirements. Cryo-losses at the 4.5 K, 80 K and 2K temperatures are calculated during the test period at CMTB (CryoModule Test Bench) at DESY to qualify the cryomodules before installation. This paper summarizes the test procedure for the different circuits (2K, 4.5K, 80K) and in different load conditions: static losses, losses due to the magnet and dynamic losses due to the RF power sent to the cavities at different MV/m levels.