Author: Iwashita, Y.
Paper Title Page
TUP007 Vortex Penetration Field in the Multilayered Coating Model 430
 
  • T. Kubo, T. Saeki
    KEK, Ibaraki, Japan
  • Y. Iwashita
    Kyoto ICR, Uji, Kyoto, Japan
 
  A multilayered structure with a single superconductor layer and a single insulator layer deposited on a bulk superconductor is studied. General formulae for the vortex penetration-field of the superconductor layer and the magnetic field on the bulk superconductor which is shielded by the superconductor and insulator layers are derived with a rigorous calculation of the magnetic field attenuation in the multilayered structure. The formulae depend not only on the material and the thickness of the superconductor layer but also on the thickness of the insulator layer. The results can be applied to superconducting accelerating cavities with the multilayered structure. Using the formulae, a combination of the thicknesses of superconductor and insulator layers to enhance the RF breakdown field limits can be found for any given materials. (Submitted on 25 Apr 2013)
T. Kubo, Y. Iwashita and T. Saeki, arXiv:1304.6876 [physics.acc-ph](Submitted on 25 Apr 2013); arXiv:1306.4823 [physics.acc-ph](Proc. of IPAC13); arXiv:1307.0583 [physics.acc-ph](Proc. of SRF2013)
 
 
TUP061 Update on Study of Welding Porosity in Nb EBW 567
 
  • Y. Iwashita, Y. Fuwa, H. Tongu
    Kyoto ICR, Uji, Kyoto, Japan
  • H. Hayano
    KEK, Ibaraki, Japan
 
  Voids have been found in the Nb EBW seams. Since the buried defects cannot be observed by the optical inspections, other techniques have to be applied to study their characteristics such as distributions. X-ray or neutron radiography have been tried for the purpose. The recent results will be presented.  
 
TUP114 XT-map System for Locating SC Cavity Quench Position 747
 
  • H. Tongu, Y. Iwashita
    Kyoto ICR, Uji, Kyoto, Japan
  • H. Hayano, Y. Yamamoto
    KEK, Ibaraki, Japan
 
  XT-map system under development in collaboration between Kyoto University and KEK is a combined system of the temperature mapping (T-map) and X-ray mapping (X-map). High resolution T-map at quench detection will give more information for improving yield in production of high performance SC Cavities. The high-density sensor distribution of the XT-map gives the high resolution. Because the huge amount of sensor lines are multiplexed at a hi-speed scanning rate in the vicinity of the sensors, the small number of signal lines makes the installation process easy and reduces the system complexity. The scanning test of this XT-map system has been performed in the vertical test at KEK. The detected quench events will be reported.