| Paper | Title | Page |
|---|---|---|
WEPH23 |
Design of Secondary Electron Emission Test Equipment with Low Electron Energy and Experimental Research | |
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| In particle accelerators, the secondary electrons resulting from the interaction between the particles and the vacuum chamber have important influence on beam quality. Especially for the positron, proton and heavy ion accelerators, massive electrons lead to electron cloud, which affect the stability, energy, emittance and beam life adversely. We designed a secondary electron emission measurement system with low electron energy and studied measurement of secondary electron emission (SEE) of metal and non-evaporable getter materials. From this system, we can obtain the characteristics of the SEE yield from non-evaporable getter materials irradiated by an electron beam with an independently adjustable energy of 50 eV to 5 keV. This paper will provide the basis for the design and construction of the new generation of particle accelerator, and can also be applied in the fields of electron microscope, electro vacuum and aerospace components. | ||