PAC09 - List of Authors (Varner, G.S.)

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Varner, G.S.

Paper	Title	Page
TH5RFP048	Performance of Coded Aperture X-Ray Optics with Low Emittance Beam at CesrTA	3561
	J.W. Flanagan, H. Fukuma, S. Hiramatsu, H. Ikeda, K. Kanazawa, T.M. Mitsuhashi, J. Urakawa KEK, Ibaraki J.P. Alexander, W.H. Hopkins, B. Kreis, M.A. Palmer, D.P. Peterson CLASSE, Ithaca, New York G.S. Varner UH, Honolulu, HI
	Funding: Work supported in part by the US-Japan Cooperation Program We are working on the development of a high-speed x-ray beam profile monitor for high-resolution and fast response for beam profile measurements to be used at CesrTA and SuperKEKB. The optics for the monitor are based on a technique borrowed from x-ray astronomy, coded-aperture imaging, which should permit broad-spectrum, low-distortion measurements to maximize the observable photon flux per bunch. Coupled with a high-speed digitizer system, the goal is to make turn-by-turn, bunch-by-bunch beam profile measurements. Following initial tests with a low-resolution mask at large beam sizes (vertical size ~200 um), a high-resolution mask has been made for use with low-emittance beams (vertical size ~10 um) at CesrTA. The first performance results of the high-resolution mask on the low-emittance CesrTA beam are presented. J.W. Flanagan et al., Proc. EPAC08, Genoa, {10}29 (2008).

Paper

Title

Page

TH5RFP048

Performance of Coded Aperture X-Ray Optics with Low Emittance Beam at CesrTA

3561

J.W. Flanagan, H. Fukuma, S. Hiramatsu, H. Ikeda, K. Kanazawa, T.M. Mitsuhashi, J. Urakawa
KEK, Ibaraki
J.P. Alexander, W.H. Hopkins, B. Kreis, M.A. Palmer, D.P. Peterson
CLASSE, Ithaca, New York
G.S. Varner
UH, Honolulu, HI

Funding: Work supported in part by the US-Japan Cooperation Program

We are working on the development of a high-speed x-ray beam profile monitor for high-resolution and fast response for beam profile measurements to be used at CesrTA and SuperKEKB*. The optics for the monitor are based on a technique borrowed from x-ray astronomy, coded-aperture imaging, which should permit broad-spectrum, low-distortion measurements to maximize the observable photon flux per bunch. Coupled with a high-speed digitizer system, the goal is to make turn-by-turn, bunch-by-bunch beam profile measurements. Following initial tests with a low-resolution mask at large beam sizes (vertical size ~200 um), a high-resolution mask has been made for use with low-emittance beams (vertical size ~10 um) at CesrTA. The first performance results of the high-resolution mask on the low-emittance CesrTA beam are presented.

*J.W. Flanagan et al., Proc. EPAC08, Genoa, {10}29 (2008).