• Y. Otake
  RIKEN Spring-8 Harima, Hyogo
• H. Ego, H. Tomizawa, K. Yanagida
  JASRI/SPring-8, Hyogo-ken
• A. Higashiya, S.I. Inoue, H. Maesaka, S. Matsubara, T. Ohshima, T. Shintake, M. Yabashi
  RIKEN/SPring-8, Hyogo

In XFEL/SPring-8, it is very important to generate an electron beam, having a low slice emittance of 0.7 pimm-mrad, a pulse width of 30 fs, and a peak current of 3 kA at an X ray lasing part. For tuning such beam to guarantee stable X ray laser generation, beam and laser monitors to diagnose the temporal structure of them are an indispensable function. The monitors, such as a beam position monitor (BPM), a TM11-mode rf beam deflector and a screen monitor (SCM), have been developed to satisfy the function. The BPM has a position resolution of less than 1 um. The SCM to observe the beam deflecting image has a position resolution of 2.5 um. The design of a longitudinal beam diagnosis system using the monitors showed that it can measure a temporal structure with a resolution of 0.5 fs along the beam pulse. The experiment to check feasibility of the BPM showed that it can work as a beam arrival timing monitor with a temporal resolution of 46 fs. A monitor system using an in-vacuum photo diode was also developed to measure the laser arrival timing, and showed ability to resolve a 2 ps time jitter. These temporal resolutions allow us fine beam tuning required for the XFEL.

• A. Maekawa, M. Uesaka
  The University of Tokyo, Nuclear Professional School, Ibaraki-ken
• H. Tomizawa
  JASRI/SPring-8, Hyogo-ken

In XFEL/SPring-8, it requires ultra high-brightness electron bunches with ultralow slice emittance and bunch duration of 30 fs (FWHM) in a lasing part. In order to measure such bunches, we are developing a single-shot, non-destructive, real-time 3-D bunch shape monitor based on EO sampling with a manner of spectral decoding. It consists of a radially polarized probe laser and 8 EO-crystals, which surround a beam axis azimuthally and their crystal-axes are radially distributed as well as Coulomb fields of electron bunches. The probe laser has a linear-chirped broad bandwidth (> 400 nm at 800 nm of a central wavelength) for higher temporal resolution, and a hollow shape to avoid interacting with electron bunches. As an EO crystal, we investigate the feasibility of an organic crystal such as a DAST for 20-fs temporal response. This monitor can measure not only longitudinal but also transverse charge distribution at the same time. These real-time 3-D bunch shape measurements are very important to optimize electron bunches for XFEL operation. We present the scheme of this monitor with its estimation in detail and report the developing status for probe laser and organic-EO-crystals.