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Shkvarunets, A.G.

Paper Title Page
TH6REP053 Determination of True RMS Emittance from OTR Measurements 4072
 
  • C. F. Papadopoulos, R.B. Fiorito, R.A. Kishek, P.G. O'Shea, A.G. Shkvarunets
    UMD, College Park, Maryland
  • M.E. Conde, W. Gai, J.G. Power
    ANL, Argonne
 
 

Funding: This work is funded by the US Dept. of Energy Offices of High Energy Physics and High Energy Density Physics, and by the US Dept. of Defense Office of Naval Research and Joint Technology Office.


Single foil OTR and two foil OTR interferometry have been successfully used to measure the size and divergence of electron beams with a wide range of energies. To measure rms emittance, two cameras are employed: one focused on the foil to obtain the spatial distribution of the beam, the other focused to infinity to obtain the angular distribution. The beam is first magnetically focused to a minimum size in directions which are orthogonal to the propagation axis, using a pair of quadrupoles. Then simultaneous measurements of the rms size (x,y) and divergence (x’,y’) of the beam are made. However, in the process of a quadrupole scan, the beam can go through a spot size minimum, a divergence minimum and a waist, i.e. the position where the cross-correlation term is zero. In general, the beam size, divergence and focusing strength for each of these conditions are different. We present new algorithms that relate the beam and magnetic parameters to the rms emittance for each of these three cases. We also compare the emittances, obtained using our algorithms and measurements made at the ANL AWA facility, with those produced by computer simulation.