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Lin, Y.K.

Paper Title Page
TH6REP004 Development of a Fast Signal-Gating Circuit for Observation of Fast Glitch of Photon Beam Intensity at NSRRC 3956
 
  • F.-T. Chung, H.-P. Chang, Y.K. Lin, Y.-H. Lin, Y.-C. Liu, C.H. Lo, Ch. Wang, M.-S. Yeh
    NSRRC, Hsinchu
 
 

Stability of photon beam intensity, I0, is one of the most important performance merits of a modern light source. The photon intensity measured at dragon beam line (BL11) is routinely used as a reference signal for I0 stability measurements. At NSRRC, a highly stable I0 intensity is maintained in most percentage of the user beam time. Meanwhile, glitches of I0 intensity up to few tens of percentage had been observed once every few operating hours, which was a puzzle before its reason had been identified later. A spontaneous large variation of photon intensity (I/I0) caused difficulties for users operating their experiments. Here, we report our development of a dedicated electronic circuit with functionality of single-gate, which was very helpful to clarify the puzzle of I0 glitches observed at NSRRC.