Paper | Title | Page |
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MO6RFP095 | The Megaelectron-Volt Ultrafast Electron Diffraction Experiment at Tsinghua University | 590 |
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Funding: Supported by National Natural Science Foundation of China (No.10735050, No.10875070) and National Basic Research Program of China (973 Program)(No.2007CB815102) Time-resolved MeV ultra-fast electron diffraction (UED) is a promising tool for studying of structural dynamics on the fundamental temporal and spatial scales of atomic motion. To reach the desired temporal and spatial resolutions, precise control and measurement of ultra-short, low emittance electron pulses are required. A MeV UED system based on an S-band photocathode RF gun is built and optimized at Tsinghua University. We present the experiment results here. |
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TH5PFP094 | Bunch Length Measurement with RF Deflecting Cavity at Tsinghua Thomson-Scattering X-Ray Source | 3429 |
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Funding: Supported by National Natural Science Foundation of China (No.10775080) An S-band RF deflecting cavity has been developed and applied for measuring the bunch length at Tsinghua Thomson-Scattering X-ray Source (TTX). This paper briefly introduces the 3-cell pi-mode standing-wave deflecting cavity and reports the recent experiments of the beam diagnostics for the photo-cathode RF gun, which produces electron bunches with RMS length around 1-ps. It is also observed that the bunches are lengthened while the total charge increases, showing the strong space charge effect at a low beam energy. |