• T. Toyama, D.A. Arakawa, A. Arinaga, Y. Hashimoto, S. Hiramatsu, S. Igarashi, S. Lee, H. Matsumoto, J.-I. Odagiri, M. Tejima, M. Tobiyama, N. Yamamoto
  KEK, Ibaraki
• K. Hanamura, S. Hatakeyama
  MELCO SC, Tsukuba
• H. Harada
  JAEA, Ibaraki-ken
• N. Hayashi, K. Yamamoto
  JAEA/J-PARC, Tokai-Mura, Naka-Gun, Ibaraki-Ken
• K. Satou
  J-PARC, KEK & JAEA, Ibaraki-ken

Beam commissioning of the J-PARC MR has been going on from May 2008. The beam was one bunch of 4·10¹¹ protons, nearly one hundredth of the design value. Here describe performances of the beam diagnostic devices: DCCT's, BPM's, BLM's, profile monitors and tune meters. Diagnostic design for the design intensity will be also included.

Slides

• J.W. Flanagan, H. Fukuma, S. Hiramatsu, H. Ikeda, K. Kanazawa, T.M. Mitsuhashi, J. Urakawa
  KEK, Ibaraki
• J.P. Alexander, W.H. Hopkins, B. Kreis, M.A. Palmer, D.P. Peterson
  CLASSE, Ithaca, New York
• G.S. Varner
  UH, Honolulu, HI

Funding: Work supported in part by the US-Japan Cooperation Program

We are working on the development of a high-speed x-ray beam profile monitor for high-resolution and fast response for beam profile measurements to be used at CesrTA and SuperKEKB*. The optics for the monitor are based on a technique borrowed from x-ray astronomy, coded-aperture imaging, which should permit broad-spectrum, low-distortion measurements to maximize the observable photon flux per bunch. Coupled with a high-speed digitizer system, the goal is to make turn-by-turn, bunch-by-bunch beam profile measurements. Following initial tests with a low-resolution mask at large beam sizes (vertical size ~200 um), a high-resolution mask has been made for use with low-emittance beams (vertical size ~10 um) at CesrTA. The first performance results of the high-resolution mask on the low-emittance CesrTA beam are presented.

*J.W. Flanagan et al., Proc. EPAC08, Genoa, {10}29 (2008).