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Guimarães-Filho, Z.O.

Paper Title Page
TH6REP040 Electron Beam Profile Determination: The Influence of Charge Saturation in Phosphor Screens 4039
 
  • T.F. Silva, Z.O. Guimarães-Filho, C. Jahnke, M.N. Martins
    USP/LAL, Sao Paulo
 
 

Funding: FAPESP, CNPq


In this work we describe a model to study the effect of charge saturation in phosphor screens in the determination of electron beam profiles. It is shown that the charge saturation introduces systematic errors in the beam diameter determination, since it tends to increase the observed beam diameter. The study is made supposing a Gaussian beam profile and a saturation model to the charge response of the phosphor material. The induced errors increase for higher currents and/or narrow beams. A possible correction algorithm that can be applied to some measurements is presented, together with a brief discussion about the consequences of these systematic errors in emittance measurements.