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Ego, H.

Paper Title Page
TH6REP042 Development Status of Beam-Monitor System at XFEL/SPring-8 (Its Temporal Resolution Issue) 4045
 
  • Y. Otake
    RIKEN Spring-8 Harima, Hyogo
  • H. Ego, H. Tomizawa, K. Yanagida
    JASRI/SPring-8, Hyogo-ken
  • A. Higashiya, S.I. Inoue, H. Maesaka, S. Matsubara, T. Ohshima, T. Shintake, M. Yabashi
    RIKEN/SPring-8, Hyogo
 
 

In XFEL/SPring-8, it is very important to generate an electron beam, having a low slice emittance of 0.7 pimm-mrad, a pulse width of 30 fs, and a peak current of 3 kA at an X ray lasing part. For tuning such beam to guarantee stable X ray laser generation, beam and laser monitors to diagnose the temporal structure of them are an indispensable function. The monitors, such as a beam position monitor (BPM), a TM11-mode rf beam deflector and a screen monitor (SCM), have been developed to satisfy the function. The BPM has a position resolution of less than 1 um. The SCM to observe the beam deflecting image has a position resolution of 2.5 um. The design of a longitudinal beam diagnosis system using the monitors showed that it can measure a temporal structure with a resolution of 0.5 fs along the beam pulse. The experiment to check feasibility of the BPM showed that it can work as a beam arrival timing monitor with a temporal resolution of 46 fs. A monitor system using an in-vacuum photo diode was also developed to measure the laser arrival timing, and showed ability to resolve a 2 ps time jitter. These temporal resolutions allow us fine beam tuning required for the XFEL.