PAC09 - List of Authors (Berkes, B.)

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

Berkes, B.

Paper	Title	Page
WE5RFP062	Compensation of the Planar Hall Effect Voltage Using a New Two-Sensor Hall Probe Design	2404
	I. Vasserman, B. Berkes, J.Z. Xu ANL, Argonne J. Kvitkovitc Slovak Academy of Sciences, Institute of Electrical Engineering, Bratislava
	*Funding: Work at Argonne supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under contract no. DE-AC02-06CH11357.** Hall probe is the best way to do tuning and measurements of insertion devices. Horizontal Hall probe magnetic field measurements in the presence of a strong vertical magnetic field were tested in 1997. The next step of this investigation was reported at the 2004 FEL Conference. Hall probe horizontal field measurements in the presence of a vertical magnetic field are complicated due to the influence of the Planar Hall probe effect on the resulting Hall voltage. 2-axis Sentron Hall probe was used for the Linear Coherent Light Source devices. By positioning the Hall probe accurately in the vertical direction, the probe could be used for fast measurements and tuning of FEL devices. To eliminate the high sensitivity to the positioning of the probe, a new type of Hall probe, consisting of two sensors combined so as to cancel the influence of the PHE, was developed at the Institute of Electrical Engineering, Slovak Academy of Sciences. The results of tests done at the APS showed that it is not sensitive to vertical position and is 60 times less sensitive than a Bell probe to the angle between the Hall sensor current and the in-plane component of the field direction.

Paper

Title

Page

WE5RFP062

Compensation of the Planar Hall Effect Voltage Using a New Two-Sensor Hall Probe Design

2404

I. Vasserman, B. Berkes, J.Z. Xu
ANL, Argonne
J. Kvitkovitc
Slovak Academy of Sciences, Institute of Electrical Engineering, Bratislava

Funding: * Work at Argonne supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under contract no. DE-AC02-06CH11357.

Hall probe is the best way to do tuning and measurements of insertion devices. Horizontal Hall probe magnetic field measurements in the presence of a strong vertical magnetic field were tested in 1997. The next step of this investigation was reported at the 2004 FEL Conference. Hall probe horizontal field measurements in the presence of a vertical magnetic field are complicated due to the influence of the Planar Hall probe effect on the resulting Hall voltage. 2-axis Sentron Hall probe was used for the Linear Coherent Light Source devices. By positioning the Hall probe accurately in the vertical direction, the probe could be used for fast measurements and tuning of FEL devices. To eliminate the high sensitivity to the positioning of the probe, a new type of Hall probe, consisting of two sensors combined so as to cancel the influence of the PHE, was developed at the Institute of Electrical Engineering, Slovak Academy of Sciences. The results of tests done at the APS showed that it is not sensitive to vertical position and is 60 times less sensitive than a Bell probe to the angle between the Hall sensor current and the in-plane component of the field direction.