IPAC2015 - List of Authors (Williams, J.E.)

Paper	Title	Page
MOPWI029	Electron Bombardment of ZnTe EO Bunch Charge Detector for Signal Lifetime Studies in Radiation Environment	1220
	J.E. Williams, S. Biedron, S.V. Milton CSU, Fort Collins, Colorado, USA S.V. Benson, S. Zhang JLab, Newport News, Virginia, USA
	Electro-optic detection of bunch charge distribution utilizing the nonlinear Pockel's and Kerr effect of materials has been implemented at various facilities as a method of passive detection for beam preservation throughout characterization. Most commonly, the inorganic II-VI material ZnTe is employed due to it's strong Pockel's EO effect and relatively high temporal resolution (~90 fs). Despite early exploration of radiation damage on ZnTe in exploration of semi-conductor materials in the 1970's, full characterization of EO response over radiation lifetime has yet to be performed. The following poster presents a method for ZnTe crystal characterization studies throughout radiation exposure at various energies and dosages by analyzing the changes in index of refraction including bulk uniformity, and THz signal response changes.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2015-MOPWI029
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Paper

Title

Page

Electron Bombardment of ZnTe EO Bunch Charge Detector for Signal Lifetime Studies in Radiation Environment

1220

J.E. Williams, S. Biedron, S.V. Milton
CSU, Fort Collins, Colorado, USA
S.V. Benson, S. Zhang
JLab, Newport News, Virginia, USA

Electro-optic detection of bunch charge distribution utilizing the nonlinear Pockel's and Kerr effect of materials has been implemented at various facilities as a method of passive detection for beam preservation throughout characterization. Most commonly, the inorganic II-VI material ZnTe is employed due to it's strong Pockel's EO effect and relatively high temporal resolution (~90 fs). Despite early exploration of radiation damage on ZnTe in exploration of semi-conductor materials in the 1970's, full characterization of EO response over radiation lifetime has yet to be performed. The following poster presents a method for ZnTe crystal characterization studies throughout radiation exposure at various energies and dosages by analyzing the changes in index of refraction including bulk uniformity, and THz signal response changes.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2015-MOPWI029

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)