Author: Fortgang, C.M.
Paper Title Page
TUPWA066 Space Charge Neutralization of Low Energy H Beam 1856
 
  • Y.K. Batygin, I. Draganić, C.M. Fortgang, G. Rouleau
    LANL, Los Alamos, New Mexico, USA
 
  LAN­SCE Ion Source Test Stand is used for sys­tem­atic study of H source per­for­mance and de­tails of low en­ergy beam trans­port. It in­cludes ce­si­ated, mul­ti­cusp-field, sur­face –pro­duc­tion H ion source, fo­cus­ing so­le­noids, slit-col­lec­tor emit­tance sta­tions, 4.5o bend­ing mag­net, and elec­tro­sta­tic de­flec­tor. Se­ries of ex­per­i­ments were per­formed to mea­sure space charge neu­tral­iza­tion of low en­ergy H beam. Mea­sure­ments were done for 80 keV and 35 keV H beams at var­i­ous pres­sure of resid­ual gas. Re­sults of mea­sure­ments are com­pared with re­sults of beam dy­nam­ics sim­u­la­tions to de­ter­mine level of space charge neu­tral­iza­tion. Ap­plic­a­bil­ity of the­o­ret­i­cal mod­els of beam neu­tral­iza­tion is dis­cussed.