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- G. Andonian, E. Hemsing, P. Musumeci, J.B. Rosenzweig
UCLA, Los Angeles, California, USA
- A.Y. Murokh
RadiaBeam, Santa Monica, USA
- D. Xiang
SLAC, Menlo Park, California, USA
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Next generation light sources require electron beams with high peak currents, typically achieved by compression techniques. The temporal diagnosis of these ultra-short beams demands enhanced resolution. We describe a scheme to achieve a temporal resolution on the order of sub-femtoseconds. The scheme is based on encoding the longitudinal profile of the beam on a transverse angular modulation, based on an interaction between the electron beam and a high-power laser in an undulator. This imposes a fast-sweep of the beam, on the order of sub-femtoseconds. A subsequent sweep in the orthogonal dimension by an rf deflecting cavity, imposes a "slow-sweep" on the order of sub-picoseconds. In this paper, we demonstrate applicability of this diagnostic scheme at the BNL ATF and specify the techniques required for practical applicability.
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