Author: Aicheler, M.
Paper Title Page
TUPS098 Machining and Characterizing X-band RF-structures for CLIC 1768
 
  • S. Atieh, M. Aicheler, G. Arnau-Izquierdo, A. Cherif, L. Deparis, D. Glaude, L. Remandet, G. Riddone, M. Scheubel
    CERN, Geneva, Switzerland
  • D. Gudkov, A. Samoshkin, A. Solodko
    JINR, Dubna, Moscow Region, Russia
  
  The Com­pact Lin­ear Col­lid­er (CLIC) is cur­rent­ly under study at CERN as a po­ten­tial mul­ti-TeV e+e– col­lid­er. The man­u­fac­tur­ing and as­sem­bling tol­er­ances for mak­ing the re­quired RF com­po­nents are es­sen­tial for CLIC to per­form ef­fi­cient­ly. Ma­chin­ing tech­niques are rel­e­vant to the con­struc­tion of ul­tra-high-pre­ci­sion parts for the Ac­cel­er­at­ing Struc­tures (AS). Op­ti­cal-qual­i­ty turn­ing and ul­tra-pre­ci­sion milling using di­a­mond tools are the main man­u­fac­tur­ing tech­niques iden­ti­fied to pro­duce ul­tra-high shape ac­cu­ra­cy parts. A shape error of less than 5 mi­crome­tres and rough­ness of Ra 0.025 are achieved. Scan­ning Elec­tron Mi­croscopy (SEM) ob­ser­va­tion as well as sub-mi­cron pre­ci­sion Co­or­di­nate Mea­sur­ing Ma­chines (CMM), rough­ness mea­sure­ments and their cru­cial en­vi­ron­ment were im­ple­ment­ed at CERN for qual­i­ty as­sur­ance and fur­ther de­vel­op­ment. This paper fo­cus­es on the en­hance­ments of pre­ci­sion ma­chin­ing and char­ac­ter­iz­ing the fab­ri­ca­tion of AS parts.  
 
TUPS099 A Study of the Surface Quality of High Purity Copper after Heat Treatment 1771
 
  • M. Aicheler, G. Arnau-Izquierdo, S. Atieh, S. Calatroni, S. Lebet, G. Riddone, A. Samoshkin
    CERN, Geneva, Switzerland
  
  The man­u­fac­tur­ing flow of ac­cel­er­at­ing struc­tures for the com­pact lin­ear col­lid­er, based on di­a­mond-ma­chined high pu­ri­ty cop­per com­po­nents, in­clude sev­er­al ther­mal cy­cles (dif­fu­sion bond­ing, braz­ing of cool­ing cir­cuits, bak­ing in vac­u­um, etc.). The high tem­per­a­ture cy­cles may be car­ried out fol­low­ing dif­fer­ent sched­ules and en­vi­ron­ments (vac­u­um, re­duc­ing hy­dro­gen at­mo­sphere, argon, etc.) and de­vel­op pe­cu­liar sur­face to­pogra­phies which have been the ob­ject of ex­tend­ed ob­ser­va­tions. This study pre­sents and dis­cuss­es the re­sults of scan­ning elec­tron mi­croscopy (SEM) and op­ti­cal mi­croscopy in­ves­ti­ga­tions.