• Y.C. Xu, Y.Z. Chen, K.C. Chu, L.F. Han, Y.B. Leng, G.B. Zhao
  SINAP, Shanghai

A new beam profile diagnostic system based on industrial Ethernet has been installed in Shanghai Deep Ultraviolet Free Electron Laser (SDUV-FEL) facility recently. By choosing GigE Vision cameras, the system provides better image quality over a long distance than before. Beam images are captured from the beam profile monitors which are controlled by air cylinders or step motors. In order to fit for the system expansibility and curtail the cables, all devices are operated through the Ethernet and distributed along the FEL facility. The approach to the design of the hardware and software will be described in this paper. Applications and experiment results will be shown in this paper as well.