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Yoneda, C.

Paper Title Page
WEPEC073 A Cryogenic RF Material Testing Facility at SLAC 3049
 
  • J. Guo, D.W. Martin, S.G. Tantawi, C. Yoneda
    SLAC, Menlo Park, California
  
 

Su­per­con­duct­ing RF is in­creas­ing­ly im­por­tant for par­ti­cle ac­cel­er­a­tors. A lot of ef­fort has been made in the SRF ma­te­ri­al re­search re­cent­ly, aim­ing to find the su­per­con­duct­ing ma­te­ri­als with bet­ter per­for­mance. We de­vel­oped a test­ing sys­tem using a res­o­nant cav­i­ty with high qual­i­ty fac­tor and an in­ter­change­able wall for the test­ing of dif­fer­ent ma­te­ri­als. The sys­tem is ca­pa­ble for high power RF cryo­genic test to find the crit­i­cal mag­net­ic field at dif­fer­ent tem­per­a­ture. The fa­cil­i­ty can be also used on test­ing the low tem­per­a­ture prop­er­ties of the nor­mal con­duct­ing ma­te­ri­al. Dif­fer­ent Cu, Nb and MgB2 sam­ples have been test­ed. In this paper, we will pre­sent the most re­cent de­vel­op­ment of the sys­tem, along with a dis­cus­sion on the re­cent test­ing re­sults.

  
THPEA064 Fabrication Technologies of the High Gradient Accelerator Structures at 100MV/m Range 3819
 
  • J.W. Wang, J.R. Lewandowski, J.W. Van Pelt, C. Yoneda
    SLAC, Menlo Park, California
  • B.A. Gudkov, G. Riddone
    CERN, Geneva
  • T. Higo, T. Takatomi
    KEK, Ibaraki
  
 

A CERN-SLAC-KEK col­lab­o­ra­tion on high gra­di­ent X-band struc­ture re­search has been es­tab­lished in order to demon­strate the fea­si­bil­i­ty of the CLIC base­line de­sign for the main linac sta­bly op­er­at­ing at more than 100 MV/m load­ed ac­cel­er­at­ing gra­di­ent. Sev­er­al pro­to­type CLIC struc­tures were suc­cess­ful­ly fab­ri­cat­ed and high power test­ed. They op­er­at­ed at 105 MV/m with a break­down rate that meets the CLIC lin­ear col­lid­er spec­i­fi­ca­tions of < 5·10-7/pulse/m. This paper sum­ma­rizes the fab­ri­ca­tion tech­nolo­gies in­clud­ing the me­chan­i­cal de­sign, pre­ci­sion ma­chin­ing, chem­i­cal clean­ing, dif­fu­sion bond­ing as well as vac­u­um bak­ing and all re­lat­ed as­sem­bly tech­nolo­gies. Also, the tol­er­ances con­trol, tun­ing and RF char­ac­ter­i­za­tion will be dis­cussed.