A   B   C   D   E   F   G   H   I   J   K   L   M   N   O   P   Q   R   S   T   U   V   W   X   Y   Z  

Xiaomeng, C.

Paper Title Page
WEPEA083 Application of Model Independent Analysis with EPICS-DDS 2675
 
  • N. Malitsky, I. Pinayev
    BNL, Upton, Long Island, New York
  • R.M. Talman
    CLASSE, Ithaca, New York
  • C. Xiaomeng
    Stony Brook University, Stony Brook
  
 

Model In­de­pen­dent Anal­y­sis (MIA) is an es­sen­tial ap­proach for mea­sur­ing op­ti­cal prop­er­ties of ac­cel­er­a­tors. In the paper, we eval­u­ate its ap­pli­ca­tion in the con­text of the NSLS-II Light Source stor­age ring. It is the first ap­pli­ca­tion of the new high-lev­el ap­pli­ca­tion en­vi­ron­ment based on the EPICS-DDS mid­dle layer. Using a full-scale vir­tu­al ac­cel­er­a­tor, the paper ex­plores the tol­er­ance of the MIA ap­proach against the dif­fer­ent con­di­tions such as mea­sure­ment noise in the beam po­si­tion mon­i­tors, mag­net er­rors, mis­align­ments, etc.