IPAC'10 - List of Authors (Varner, G.S.)

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Varner, G.S.

Paper	Title	Page
MOPE007	Measurement of Low-Emittance Beam with Coded Aperture X Ray Optics at CesrTA	966
	J.W. Flanagan, H. Fukuma, H. Ikeda, T.M. Mitsuhashi KEK, Ibaraki J.P. Alexander, N. Eggert, W.H. Hopkins, M.A. Palmer, D.P. Peterson CLASSE, Ithaca, New York B. Kreis Cornell University, Ithaca, New York G.S. Varner UH, Honolulu, HI
	An x-ray beam size monitor based on coded aperture imaging* has been developed at CesrTA, for the purpose of making bunch-by-bunch, turn-by-turn measurements of low emittance beams. Using low-emittance beam (~44 pm, or 16 microns at the x-ray source point) we have been able to make detailed comparisons between the measured mask response and that predicted by theory, validating our simulations of the mask response. In turn, we demonstrate the ability to measure both integrated and single-bunch turn-by-turn beam sizes and positions for monitoring the progress of the low-emittance tuning of the machine, and for electron-cloud instability-related beam dynamics studies. * J.W. Flanagan et al., EPAC08, 1029 (2008).

Paper

Title

Page

MOPE007

Measurement of Low-Emittance Beam with Coded Aperture X Ray Optics at CesrTA

966

J.W. Flanagan, H. Fukuma, H. Ikeda, T.M. Mitsuhashi
KEK, Ibaraki
J.P. Alexander, N. Eggert, W.H. Hopkins, M.A. Palmer, D.P. Peterson
CLASSE, Ithaca, New York
B. Kreis
Cornell University, Ithaca, New York
G.S. Varner
UH, Honolulu, HI

An x-ray beam size monitor based on coded aperture imaging* has been developed at CesrTA, for the purpose of making bunch-by-bunch, turn-by-turn measurements of low emittance beams. Using low-emittance beam (~44 pm, or 16 microns at the x-ray source point) we have been able to make detailed comparisons between the measured mask response and that predicted by theory, validating our simulations of the mask response. In turn, we demonstrate the ability to measure both integrated and single-bunch turn-by-turn beam sizes and positions for monitoring the progress of the low-emittance tuning of the machine, and for electron-cloud instability-related beam dynamics studies.

* J.W. Flanagan et al., EPAC08, 1029 (2008).