• S. Ito, H. Matsuzaki, Y. Miyairi, A. Morita, N. Nakano, Y. Sunohara
  The University of Tokyo, Tokyo

RAPID (Rutherford Backscattering Spectroscopic Analyzer with Particle Induced X-ray Emission and Ion Implantation Devices), the University of Tokyo has been dedicated to various scientific and engineering studies in a wide range of fields by the ion beam analysis availability, including RBS, NRA, PIXE and ion implantation. The system consists of a 1.7MV tandem accelerator (Model 4117-HC,provided by HVEE corp., Netherland), two negative ion sources (a Cs sputter solid ion source and duoplasmatron gas ion source) and three beam lines. RAPID was installed in 1994 at Research Center for Nuclear Science and Technology, the University of Tokyo at first and since then it has been used for various research fields using ion beams. As the Center was reorganized to be a department of School of Engineering in 2005, the educational utilization came to be an important mission of RAPID. Besides several application studies with PIXE analysis, environmental analysis (pond sediments and atmospheric SPM (Suspended Particulate Matter) is performed as a student experiment. Recently, a low level ion irradiation system was also developed and applied for the study of CR-39 track detector with proton beam.