| Paper | Title | Page |
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| TUPEA077 | Low-Secondary Electron Yield of Ferrromagnetic Materials and Magnetized Surfaces | 1500 |
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We are presenting first results of direct measurements of the secondary electron emission yield (SEY) for several magnetic materials like ferrites at energies of primary electrons from 5 to 1000 eV. In order to minimize the impact of surface charging, the primary electron beam had a short pulse modulation of 400ns with a very low repetition rate. This paper discusses a method of developing a secondary-electron-suppressing highly textured ferrite surface with low SEY by depositing a layer of very fine ferrite particles onto a substrate. The experimental results indicate that the SEY of the particulate ferrite surfaces is much lower than that of flat ferrites. In comparison we have confirmed that ordinary carbon coating with rather large grain size returns SEY value close to unity. However, a surface with very finely powdered carbon has a much smaller secondary emission yield of about 0.5, but the adhesion of these carbon powders to the surface is often not reliable enough for many applications. As a remarkable fact it has been found that gold- and also carbon-coated ferrites have SEY peak values lower than unity up to 1000eV. |
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| WEPEC002 | Titanium Nitride Coating as a Multipactor Suppressor | 2887 |
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LAL-Orsay is developing an important effort on R&D and technology studies on RF power couplers for superconductive cavities. One of the most critical components of those devices is the ceramic RF window that allows the power flux to be injected in the coaxial line. The presence of a dielectric window on a high power RF line has a strong influence on the multipactor phenomena. The most important method to reduce the multipactor is to decrease the secondary emission yield of the ceramic window. Due to its low Secondary electron Emission Yield (SEY), TiN thin film is used as a multipactor suppressor coating on RF ceramic coupler windows. In this frame work, TiN deposition was made by magnetron reactive sputtering. XPS and XRD analysis were performed to control the film composition and stoechiometry. Coating thickness was optimized so that the TiN coating effectively reduces the SEY but does not cause excessive heating, due to ohmic loss. For this purpose, SEY measurements on covered and uncovered TiN Alumina substrates, multipactor level breakdown on TiN coated Cupper substrates and RRR measurements were performed for different deposit thicknesses. |