• S. Ito, H. Matsuzaki, Y. Miyairi, A. Morita, N. Nakano, Y. Sunohara
  The University of Tokyo, Tokyo

RAPID (Ruther­ford Backscat­ter­ing Spec­tro­scop­ic An­a­lyz­er with Par­ti­cle In­duced X-ray Emis­sion and Ion Im­plan­ta­tion De­vices), the Uni­ver­si­ty of Tokyo has been ded­i­cat­ed to var­i­ous sci­en­tif­ic and en­gi­neer­ing stud­ies in a wide range of fields by the ion beam anal­y­sis avail­abil­i­ty, in­clud­ing RBS, NRA, PIXE and ion im­plan­ta­tion. The sys­tem con­sists of a 1.7MV tan­dem ac­cel­er­a­tor (Model 4117-HC,pro­vid­ed by HVEE corp., Nether­land), two neg­a­tive ion sources (a Cs sput­ter solid ion source and duo­plas­ma­tron gas ion source) and three beam lines. RAPID was in­stalled in 1994 at Re­search Cen­ter for Nu­cle­ar Sci­ence and Tech­nol­o­gy, the Uni­ver­si­ty of Tokyo at first and since then it has been used for var­i­ous re­search fields using ion beams. As the Cen­ter was re­or­ga­nized to be a de­part­ment of School of En­gi­neer­ing in 2005, the ed­u­ca­tion­al uti­liza­tion came to be an im­por­tant mis­sion of RAPID. Be­sides sev­er­al ap­pli­ca­tion stud­ies with PIXE anal­y­sis, en­vi­ron­men­tal anal­y­sis (pond sed­i­ments and at­mo­spher­ic SPM (Sus­pend­ed Par­tic­u­late Mat­ter) is per­formed as a stu­dent ex­per­i­ment. Re­cent­ly, a low level ion ir­ra­di­a­tion sys­tem was also de­vel­oped and ap­plied for the study of CR-39 track de­tec­tor with pro­ton beam.