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Leng, Y.B.

Paper Title Page
MOPE033 A New Beam Profile Diagnostic System based on the Industrial Ethernet 1044
 
  • Y.C. Xu, Y.Z. Chen, K.C. Chu, L.F. Han, Y.B. Leng, G.B. Zhao
    SINAP, Shanghai
  
 

A new beam pro­file di­ag­nos­tic sys­tem based on in­dus­tri­al Eth­er­net has been in­stalled in Shang­hai Deep Ul­tra­vi­o­let Free Elec­tron Laser (SDUV-FEL) fa­cil­i­ty re­cent­ly. By choos­ing GigE Vi­sion cam­eras, the sys­tem pro­vides bet­ter image qual­i­ty over a long dis­tance than be­fore. Beam im­ages are cap­tured from the beam pro­file mon­i­tors which are con­trolled by air cylin­ders or step mo­tors. In order to fit for the sys­tem ex­pan­si­bil­i­ty and cur­tail the ca­bles, all de­vices are op­er­at­ed through the Eth­er­net and dis­tribut­ed along the FEL fa­cil­i­ty. The ap­proach to the de­sign of the hard­ware and soft­ware will be de­scribed in this paper. Ap­pli­ca­tions and ex­per­i­ment re­sults will be shown in this paper as well.

  
WEPEB010 Soft IOC Application in SSRF Beam Diagnostics System 2707
 
  • Y.B. Yan, Y.B. Leng
    SINAP, Shanghai
  
 

Soft IOC is an ideal so­lu­tion for high level glob­al ap­pli­ca­tion of ac­cel­er­a­tor con­trol and beam di­ag­nos­tics due to easy on­line mod­i­fi­ca­tion and re­boot­ing. SSRF beam di­ag­nos­tics sys­tem em­ploy­ees two soft IOCs to han­dle glob­al tasks such as BPMs group ac­cess, orbit per­for­mance an­a­lyze and on­line data re­li­a­bil­i­ty an­a­lyze, which are hard­ly per­formed in bot­tom level IOC side and OPI side. This paper in­tro­duces the cur­rent sta­tus and fu­ture up­grade plan.

  
MOPE034 Data Acquisition for SSRF Ring Bunch Charge Monitor 1047
 
  • Y.B. Leng, Y.B. Yan, L.Y. Yu, W.M. Zhou
    SSRF, Shanghai
  
 

Bunch charge uni­for­mi­ty con­trol is very im­por­tant for stor­age ring top-up op­er­a­tion. In order to mon­i­tor fill­ing pat­tern and mea­sure bunch charge pre­cise­ly an PXI wave­form dig­i­tiz­er based data ac­qui­si­tion sys­tem was de­vel­oped to re­trieve bunch charge in­for­ma­tion from BPM pick­up sig­nals. Ef­fec­tive sam­pling rate could be ex­tend­ed to 400GHz by wave­form re­build­ing tech­nol­o­gy, which folds multi turns data into sin­gle turn with real time sam­pling rate of 8GHz. On­line eval­u­a­tion shows charge res­o­lu­tion could be bet­ter than 0.5% for 1nC range.