• Y.C. Xu, Y.Z. Chen, K.C. Chu, L.F. Han, Y.B. Leng, G.B. Zhao
  SINAP, Shanghai

A new beam profile diagnostic system based on industrial Ethernet has been installed in Shanghai Deep Ultraviolet Free Electron Laser (SDUV-FEL) facility recently. By choosing GigE Vision cameras, the system provides better image quality over a long distance than before. Beam images are captured from the beam profile monitors which are controlled by air cylinders or step motors. In order to fit for the system expansibility and curtail the cables, all devices are operated through the Ethernet and distributed along the FEL facility. The approach to the design of the hardware and software will be described in this paper. Applications and experiment results will be shown in this paper as well.

• Y.B. Yan, Y.B. Leng
  SINAP, Shanghai

Soft IOC is an ideal solution for high level global application of accelerator control and beam diagnostics due to easy online modification and rebooting. SSRF beam diagnostics system employees two soft IOCs to handle global tasks such as BPMs group access, orbit performance analyze and online data reliability analyze, which are hardly performed in bottom level IOC side and OPI side. This paper introduces the current status and future upgrade plan.

• Y.B. Leng, Y.B. Yan, L.Y. Yu, W.M. Zhou
  SSRF, Shanghai

Bunch charge uniformity control is very important for storage ring top-up operation. In order to monitor filling pattern and measure bunch charge precisely an PXI waveform digitizer based data acquisition system was developed to retrieve bunch charge information from BPM pickup signals. Effective sampling rate could be extended to 400GHz by waveform rebuilding technology, which folds multi turns data into single turn with real time sampling rate of 8GHz. Online evaluation shows charge resolution could be better than 0.5% for 1nC range.