• K. Shinto
  JAEA, Rokkasho, Kamikita, Aomori
• O. Kaneko, M. Nishiura, K. Tsumori
  NIFS, Gifu
• M. Kisaki, M. Sasao
  Tohoku University, School of Engineering, Sendai
• M. Wada
  Doshisha University, Graduate School of Engineering, Kyoto

We propose a negative ion beam probe system as a new scheme to diagnose beam profile of high power positive ion beams. Two RF linacs of IFMIF have to drive the neutron source by providing continuous-wave (CW) positive deuterium ion beams with the intensity of 125 mA each at the beam energy of 40 MeV. During the CW beam operations, the extreme intensity of the beam and the severe radiation levels make the beam diagnostics with conventional techniques in the transport lines terribly difficult. A beam of negative ions liable to lose the additional electron at the occasion of impact with a high energy particle can work as a probe to measure the positive ion beam profile. On possible configuration to achieve high intensity beam profile measurement is to inject a negative ion probe beam into the target beam perpendicularly, and measure the attenuation of the negative ion beam by beam-beam interaction at each position. We have started an experimental study for the proof-of-principle of the new beam profile monitoring system. The paper presents the status quo of this beam profile monitor system development and the prospects to apply the system to the IFMIF beam line controls.