• K. Shinto
  JAEA, Rokkasho, Kamikita, Aomori
• O. Kaneko, M. Nishiura, K. Tsumori
  NIFS, Gifu
• M. Kisaki, M. Sasao
  Tohoku University, School of Engineering, Sendai
• M. Wada
  Doshisha University, Graduate School of Engineering, Kyoto

We pro­pose a neg­a­tive ion beam probe sys­tem as a new scheme to di­ag­nose beam pro­file of high power pos­i­tive ion beams. Two RF linacs of IFMIF have to drive the neu­tron source by pro­vid­ing con­tin­u­ous-wave (CW) pos­i­tive deu­teri­um ion beams with the in­ten­si­ty of 125 mA each at the beam en­er­gy of 40 MeV. Dur­ing the CW beam op­er­a­tions, the ex­treme in­ten­si­ty of the beam and the se­vere ra­di­a­tion lev­els make the beam di­ag­nos­tics with con­ven­tion­al tech­niques in the trans­port lines ter­ri­bly dif­fi­cult. A beam of neg­a­tive ions li­able to lose the ad­di­tion­al elec­tron at the oc­ca­sion of im­pact with a high en­er­gy par­ti­cle can work as a probe to mea­sure the pos­i­tive ion beam pro­file. On pos­si­ble con­fig­u­ra­tion to achieve high in­ten­si­ty beam pro­file mea­sure­ment is to in­ject a neg­a­tive ion probe beam into the tar­get beam per­pen­dic­u­lar­ly, and mea­sure the at­ten­u­a­tion of the neg­a­tive ion beam by beam-beam in­ter­ac­tion at each po­si­tion. We have start­ed an ex­per­i­men­tal study for the proof-of-prin­ci­ple of the new beam pro­file mon­i­tor­ing sys­tem. The paper pre­sents the sta­tus quo of this beam pro­file mon­i­tor sys­tem de­vel­op­ment and the prospects to apply the sys­tem to the IFMIF beam line con­trols.