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Han, L.F.

Paper Title Page
MOPE033 A New Beam Profile Diagnostic System based on the Industrial Ethernet 1044
 
  • Y.C. Xu, Y.Z. Chen, K.C. Chu, L.F. Han, Y.B. Leng, G.B. Zhao
    SINAP, Shanghai
  
 

A new beam pro­file di­ag­nos­tic sys­tem based on in­dus­tri­al Eth­er­net has been in­stalled in Shang­hai Deep Ul­tra­vi­o­let Free Elec­tron Laser (SDUV-FEL) fa­cil­i­ty re­cent­ly. By choos­ing GigE Vi­sion cam­eras, the sys­tem pro­vides bet­ter image qual­i­ty over a long dis­tance than be­fore. Beam im­ages are cap­tured from the beam pro­file mon­i­tors which are con­trolled by air cylin­ders or step mo­tors. In order to fit for the sys­tem ex­pan­si­bil­i­ty and cur­tail the ca­bles, all de­vices are op­er­at­ed through the Eth­er­net and dis­tribut­ed along the FEL fa­cil­i­ty. The ap­proach to the de­sign of the hard­ware and soft­ware will be de­scribed in this paper. Ap­pli­ca­tions and ex­per­i­ment re­sults will be shown in this paper as well.