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MOPB025 |
Heating Analysis and the Solutions of DCCT System for BEPCII |
92 |
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- Y. Zhao, J.S. Cao, J. He, Y.F. Sui, L. Wang
IHEP, Beijing, People's Republic of China
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The BEPCII e+ DCCT is damaged due to a high temperature heating. After 8 years operating, it is not working properly in 2014. As the BEPCII is trying to reach high luminosity, the CT will be a defective component with the high beam current, therefore a spare one has replaced it. In order to determine the heating source, some experiments and simulations have been done. A new vacuum chamber structure has been designed to solve the problem. The analysis and result can be also applied to CT designs in the future.
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