IBIC2015 - List of Authors (Flanagan, J.W.)

Paper	Title	Page
MOPB018	Data Acquisition System for SuperKEKB Beam Loss Monitors	75
	M. Tobiyama, J.W. Flanagan, H. Ikeda KEK, Ibaraki, Japan
	The monitoring of the beam loss distribution along the accelerator is important in order to prevent damage of the vacuum components, and, in addition, to suppress the unnecessary irradiation of the accelerator elements. As it is not easy to construct the readout system to be synchronised to a fast timing signal, such as beam injection, a new 64-ch ADC system has been developed that samples the output of the loss monitor signal integrator with a fairly fast rate and automatically keeps the peak, mean and minimum of the data. The performance of the ADC system will be shown. The control system configuration that reads and resets the hardware interlock signal from the loss monitor signal integrator for the machine protection system (MPS) will also be presented.
	Poster MOPB018 [0.362 MB]
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TUPB025	Design of Coded Aperture Optical Elements for SuperKEKB X-ray Beam Size Monitors	377
	E. Mulyani Sokendai, Ibaraki, Japan J.W. Flanagan KEK, Ibaraki, Japan
	We describe the design of coded aperture optical elements for the SuperKEKB x-ray beam size monitors. X-ray beam profile monitor are being installed in each ring of SuperKEKB (LER and HER) to provide high resolution bunch-by-bunch, turn-by-turn measurement capability for low emittance tuning, collision tuning and instability measurements. We use two types of optical elements, single-slit (pinhole) and multi-slit optical elements (coded apertures, CA). CA imaging offers greater open aperture than a single pinhole, for greater photon throughput and better statistical resolution for single-shot measurements. X-rays produced by a hard-bend magnet pass through a pinhole or CA optical element onto a detector. The resolution is obtained by calculating the differences between the images recorded by the detector for various simulated beam sizes, for a given number of photons. The CA elements that we have designed for use at SuperKEKB are estimated to provide 1.25-2.25 microns resolution for 10-25 microns of vertical beam sizes at 1 mA bunches. We present the design principle and optimizing process used to optimize the resolution at various beam sizes for SuperKEKB.
	Poster TUPB025 [6.149 MB]
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Paper

Title

Page

Data Acquisition System for SuperKEKB Beam Loss Monitors

75

M. Tobiyama, J.W. Flanagan, H. Ikeda
KEK, Ibaraki, Japan

The monitoring of the beam loss distribution along the accelerator is important in order to prevent damage of the vacuum components, and, in addition, to suppress the unnecessary irradiation of the accelerator elements. As it is not easy to construct the readout system to be synchronised to a fast timing signal, such as beam injection, a new 64-ch ADC system has been developed that samples the output of the loss monitor signal integrator with a fairly fast rate and automatically keeps the peak, mean and minimum of the data. The performance of the ADC system will be shown. The control system configuration that reads and resets the hardware interlock signal from the loss monitor signal integrator for the machine protection system (MPS) will also be presented.

Poster MOPB018 [0.362 MB]

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reference for this paper to ※ BibTeX, ※ LaTeX, ※ Text, ※ RIS/RefMan, ※ EndNote (xml)

TUPB025

Design of Coded Aperture Optical Elements for SuperKEKB X-ray Beam Size Monitors

377

E. Mulyani
Sokendai, Ibaraki, Japan
J.W. Flanagan
KEK, Ibaraki, Japan

We describe the design of coded aperture optical elements for the SuperKEKB x-ray beam size monitors. X-ray beam profile monitor are being installed in each ring of SuperKEKB (LER and HER) to provide high resolution bunch-by-bunch, turn-by-turn measurement capability for low emittance tuning, collision tuning and instability measurements. We use two types of optical elements, single-slit (pinhole) and multi-slit optical elements (coded apertures, CA). CA imaging offers greater open aperture than a single pinhole, for greater photon throughput and better statistical resolution for single-shot measurements. X-rays produced by a hard-bend magnet pass through a pinhole or CA optical element onto a detector. The resolution is obtained by calculating the differences between the images recorded by the detector for various simulated beam sizes, for a given number of photons. The CA elements that we have designed for use at SuperKEKB are estimated to provide 1.25-2.25 microns resolution for 10-25 microns of vertical beam sizes at 1 mA bunches. We present the design principle and optimizing process used to optimize the resolution at various beam sizes for SuperKEKB.

Poster TUPB025 [6.149 MB]

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reference for this paper to ※ BibTeX, ※ LaTeX, ※ Text, ※ RIS/RefMan, ※ EndNote (xml)